Thomas F. Kelly, Steam Instruments, Inc., Brian P. Gorman, Colorado School of Mines, Simon P. Ringer, University of Sydney
Publisher: Cambridge University Press Online publication date: March 2022 Print publication year: 2022
Online ISBN: 9781316677292 DOI: https://doi.org/10.1017/9781316677292
Book Description
A comprehensive guide on Atomic-Scale Analytical Tomography (ASAT) that discusses basic concepts and implications of the technique in areas
such as material sciences, microscopy, engineering sciences and several interdisciplinary avenues. The title interrogates how to successfully
achieve ASAT at the intersection of transmission electron microscopy and atom probe microscopy. This novel concept is capable of identifying
individual atoms in large volumes as well as in 3D, with high spatial resolution. Written by leading experts from academia and industry, this
book serves as a guide with real-world applications on cutting-edge research problems. An essential reading for researchers, engineers and
practitioners interested in nanoscale characterisation, this book introduces the reader to a new direction for atomic-scale microscopy.
Review
‘The quest for making better materials is ultimately linked to understanding the role of each individual atom in its place and its chemical
environment. Three pioneers in the field guide us through a comprehensive scenario of how this can be achieved by combining the two most
advanced atomic-scale characterization techniques: atom probe tomography and transmission electron microscopy.’
Joachrim Mayer – RWTH Aachen University